Eung-Joo Lee

Dr. Eung-Joo Lee’s research focuses on the development of efficient deep learning algorithms designed for semiconductor applications, such as defect detection using AI-driven computer vision techniques. He aims to design deep learning systems optimized for embedded computer vision platforms, leveraging computationally efficient models. His current research topics include various AI applications involving detection, segmentation, and classification across diverse imaging modalities. 

Focus Area

My research interest lies in developing efficient deep learning algorithms designed for semiconductor applications.